META Conference, META'12

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Characterization of Metamaterials through Parallel-Plate Waveguide Measurements
S. Weiss, A. I. Zaghloul, Y.M. Lee, T.K. Anthony

Last modified: 2012-02-08

Abstract


Metamaterials are usually characterized by analysis, simulation, or measurements. Constitutive parameters of the metamaterial medium and the corresponding refractive index have been measured using focusing dielectric lenses, and variations of the parameters with inclined angles and have been demonstrated.  In this paper, a parallel-plate waveguide is selected as the transmission medium for performing the measurements of metamaterial parameters.  Parallel-plate waveguides are the propagation media for some structures, such as a Rotman lens. In addition to proving the metamaterial characteristics, performing the measurements in a parallel-plate waveguide medium presents several challenges.  Among the challenges are the structural integrity, edge reflection and diffraction, and asymmetry of inclined incidence due to the finiteness of the ground planes.  Calibration of the parallel plate structure to perform measurements in free-space medium is first addressed.  Measurements of the refractions that result from inserting the metamaterial inside the parallel-plate structure are then performed.