Metamaterials and negative index materials IV

15:10 Keynote talk : How to deal with the loss in Plasmonics and Metamaterials

Jacob B. Khurgin

Johns Hopkins University (USA)

Recent years have seen staggering growth of interest in using nanostructured metals in optical range with the goal of enhancing linear and nonlinear optical properties or even engineering novel optical properties unknown in Nature - usually this burgeoning field is referred to as Plasmonics and Metamaterials. After the initial years of excitement the community is slowly beginning to recognize that loss in the metal is an important factor that might impede practical application of plasmonic devices, be it in signal processing, sensing, imaging or more esoteric applications like cloaking.
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15:40 : Apex angle-dependent resonances in triangular split-ring resonators

Max Burnett, Michael Fiddy

University of North Carolina at Charlotte (USA)

Along with other frequency selective structures (circles and squares), triangular split-ring resonators (TSRRs) only allow frequencies near the center resonant frequency to propagate. Further, TSRRs are attractive due to their small surface area, comparatively, and large quality (Q) factors. Beyond frequency selection, TSRRs are capable of left-handedness and negative permittivities. Here we examine the effects of varying the apex angle on the resonant frequency and the Q factor within the GHz frequency regime.
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15:55 : Co-Designed Meso-Photonic Broadband Solar Absorber

Abul Azad (1),Milan Sykora (1),Nina Weisse-Bernstein (1),Ting Luk (2),Diego Dalvit (1),Hou-Tong Chen (1),Antoinette Taylor (1)

(1)Los Alamos National Laboratory (USA) , (2)Sandia National Laboratory (USA)

We demonstrate an ultra-thin, ultra-wideband meso-photonic material capable of absorbing over entire solar spectrum. The co-designed approach enables selective absorption of solar radiation for any desired spectral window.
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16:10 : Ellipsometry characterization of semiconductor hyperbolic metamaterials

T. S. Luk, T. Tiwald, S. Campione, J. F. Klem, T. Beechem, A. Benz, M. B. Sinclair

Sandia National Laboratories (USA)

We report on an ellipsometry characterization method for semiconductor hyperbolic metamaterials not as a single effective medium layer but as a multilayer of alternating doped and undoped layers. Our results show that the doped layers should be modeled as uniaxial materials to accurately recover measured ellipsometry data. This anisotropic effective medium theory provides a more reliable out-of-plane dielectric function than the single effective medium method. This multilayer method enables accurate characterization of semiconductor hyperbolic metamaterials for light-matter interaction research.
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