The Near Field Characteristics of the Focused Field Embedded in a InSb Super Resolution Layer

P.H. Urbach; A.C. Assafrao; S.F. Pereira

META 2021, META'12

P.H. Urbach, A.C. Assafrao, S.F. Pereira

Last modified: 2012-01-06

Abstract

We present a rigorous numerical model to study the characteristics of the focused spot embedded in a Super Resolution Near Field (Super-RENS) stack layer. The model is based on experimental evidences of the super resolution layer state change. The results indicate that a focused spot beyond the diffraction limit can be achieved in the near field domain.